CD Skripsi

Karakterisasi Perbedaan Suhu Annealing Film Tipis Bazr0,3ti0,7o3 Dengan Menggunakan X-Ray Diffraction (Xrd)

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A thin layer of Barium Zirconium Titanate (BaZr0,3Ti0,7O3) will be grown on a glass substrate using sol-gel method with variations in annealing temperature assisted by a spin coating process at 3000 rpm for 30 seconds. The BaZr0,3Ti0,7O3 thin layer was annealed for 1 hour at a temperature of 600
C and 650
C. Characterization was carried out using X-Ray Diffractometer (XRD) to determine the crystal structure, lattice parameters, structure type, different atomic arrangements in the crystal, the presence of imperfections in the crystal and grain size. The crystal structure shows that the lattice parameter is a=b≠c, so it can be concluded that the crystal structure is tetragonal. The two annealing temperatures produced in XRD characterization produced the same 2θ angles, namely 22.29
, 31.61
, 38.31
and 47.54
. . The increase in annealing temperature does not affect the diffraction angle but rather affects the intensity.
Keywords: thin layer BaZr0,3Ti0,7O3, sol-gel method, characterization of X-Ray Diffraction

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Ketersediaan

Informasi Detail

Judul Seri

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No. Panggil

03 01.120 (0097)

Penerbit

Pekanbaru : Universitas Riau – FMIPA – FISIKA., 2020

Deskripsi Fisik

xv, 41 hlm.: ill.: 29 cm

Bahasa

Indonesia

ISBN/ISSN

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Klasifikasi

03 01.120 (0097)

Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

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Subjek

FISIKA

Info Detail Spesifik

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Pernyataan Tanggungjawab

ELFITRA

Versi lain/terkait

Lampiran Berkas

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