CD Skripsi
Fabrikasi Dan Karakterisasi Lapisan Tipis Bahan Feroelektrik (0,2) − (0,8)Sebagai Multilayer Ceramic Capasitor (MLCC)
The ceramic of (0,2)BaTiO3–(0,8)BaZr0.5Ti0.5O3 (BT-BZT) system has been manufactured to meet the specifications of the Multilayer Ceramic Capacitor (MLCC). This study aims to determine the effect of annealing temperature on the optical properties, crystal structure, morphological structure, and dielectric properties of BT-BZT materials using X-Ray Diffraction (XRD) characterization, Uv-Vis, Field Emission Scanning Electron Microscopy (FESEM), and Impedance Spectroscopy. BT-BZT samples were prepared using the sol-gel method on FTO substrate, then annealed at 700°C, 750°C and 800°C. The temperature variation aims to obtain a better crystal level, a larger crystal size and to obtain dielectric properties at high temperatures that meet the MLCC. UV-Vis absorption spectrum shows the optical absorption peaks of each sample BT-BZT700, BT-BZT750, and BT-BZT800 obtained at wavelengths of 314 nm, 311 nm and 309 nm. Respectivity energy band gap values of the samples annealed at 700 °C, 750 °C and 800 °C were 3,72 eV, 3,725 eV and 3,74 eV. X-ray diffraction pattern provides information that the BT-BZT sample has a crystal structure of the tetragonal type. With an increase in annealing temperature result an increasingly crystalline crystal structure, the crystal size of the BT-BZT samples at temperatures of 700°, 750° and 800° obtained are 20,1297 nm, 24,8370 nm and 20,783 nm. FESEM micrograph of the BT-BZT sample is shown to have an irregular spherical shape. The average grain size is affected by an increase in annealing temperature. The grain size increased to 205,83 ± 48,34 nm, 252,53 ± 68,66 nm, dan 292,43 ± 50,69 nm at 700, 750 and 800 °C. An increase in annealing temperature will also produce a larger value of capacitance and dielectric constant so that the BT-BZT sample is good for application as a Multilayer Ceramic Capacitor (MLCC).
Keywords : Dielectric; Impedance ; BaZrTiO3 ; MLCC
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