CD Skripsi
Pembuatan Dan Karakterisasi Film Tipis Ba0,2sr0,8TIO3 Menggunakan Xrd, Fesem Dan Spektroskopi Impedansi
A Barium Strontium Titanate (BST) thin film with Ba0.2Sr0.8TiO3 structure has been made using the sol-gel method and annealed at temperature of 600°C and 650°C. The thin film of BST was characterized using X-ray Diffraction (XRD), Field Emission Scanning Electron Microscopy (FESEM), and impedance spectroscopy. The result of XRD characterization showed that the crystalline improved as the annealing temperature increased with cubic structures. The FESEM characterization in and 650 temperatures resulted grain sizes of 31.3 nm; 39.1 nm and the thickness of 51.36 nm; 53.59 nm respectively. The result of impedance spectroscopy in temperatures of and 650 and frequency of 100 Hz found that the capacitance values are ; , the dielectric constant values are 3.52262; 4.10499, and the loss dielectric values are 0.024507 dan 0.00403 respectively. The results of impedance also showed that the greater frequency, the smaller complex capacitance, dielectric constant, and loss dielectric are.
Keywords : Barium Strontium Titanate, sol gel method, XRD, FESEM, impedance spectroscopy
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