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Fabrikasi Dan Karakterisasi Material Ferroelektrik Barium Zirkonium Titanat (Bzt) Dengan Variasi Komposisi Bazrxti(1-X)O3 (X=0,55; 0,60 Dan 0,65) Menggunakan Metode Sol – Gel
Thin films of Barium Zirconium Titanate (BaZrxTi1-xO3) with various composition, namely x = 0,55; 0,60 and 0,65 have been successfully prepared using the sol-gel method. The films were annealed at 600 ° C and 650 ° C for 1 hour. The thin films were characterized using UV-Vis spectroscopy and X-Ray Diffractometer (XRD). UV-Vis spectroscopy provides absorbance data, that can be used to obtain the value of transmittance, refractive index, sample thickness, absorption coefficient and energy band gap. The optical energy band gap width of the BZT thin film with x = 0,55 at 600ºC and 650ºC is 3,82 eV; 3,79 eV, for x = 0,60 is 3,60 eV; 3,76 eV and for x = 0,65 is 3,81 eV; 3,78 eV, respectively. The results of characterization using XRD showed that the structure of the crystal is tetragonal with the lattice parameters of x = 0,55 a = b = 3,96Å ≠ c = 4,26Å, for x = 0,60 a = b = 3,95 Å ≠ c = 4,26Å, and for x = 0,65 a = b = 3,93 Å ≠ c = 4,28 Å. The crystallinity level becomes higher with increasing annealing temperature, that is indicated by greater intensity.
Keywords: Barium Zirconium Titanate, Sol-gel method, Annealing, energy band gap, Crystal structure, thickness
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