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Efek Persentase Galium Pada Penumbuhan Nanorod Zno Yang Di-Doping Galium-Boron
The growth of ZnO nanorods have succesfully been performed onto the surface of Fluorine Tin Oxide (FTO) by using a hydrothermal method. In this study, it was analyzed the effect of variations in the percentage of gallium of 1%; 1.5%; 2%; 3% with persentage of boron of 1% to the growth of ZnO nanorods. The samples were characterized by using Field Emission Scanning Electron Microscope (FESEM), Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and UV-Vis Spectroscopy. FESEM photograph illustrated the gallium-boron doped ZnO nanorods grew on the surface of the FTO having a hexagonal-shaped face with their diameter produced quite varied in the range 87-400 nm. The addition of gallium percentage caused ZnO nanorods structure became more uniform. Cross sectional FESEM images showed that with the increasing number of doping gallium, then the ZnO nanorods formed shorter. The grown ZnO nanorods also tended to skew. The weight percentage of B, O, Zn, Ga respectively was 5.37%, 20.42%, 69.70% and 0.39%, whereas their atomic percentage was 15.58%, 40.04%, 33.45% and 0.18% respectively. XRD patterns of samples illustrated five diffraction peaks located at 2θ angle: 31.22°; 34.47°; 36.05°, 47.02° and 55.08°, respectively in accordance with the crystal planes hkl (100), (002), (101), (102) and (110). The highest level of crystallinity of the samples was gallium 3% sample with its FWHM of 0,215o and its crystal size of 39.714 nm. Crystal size was inversely proportional to the value of FWHM. UV-Vis absorption spectra showed that the optimal absorption of the sample occursed at wavelength of 300-380 nm for all samples with the highest absorption peak obtained from the sample with gallium percentage of 1.5%. This results was in accordance to FESEM and XRD analysis that showed the best quality of the samples.
Keywords: nanorod, Zinc Oxide, co-doping, FESEM, XRD, UV-Vis
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